No. |
Part Name |
Description |
Manufacturer |
2341 |
SNJ54ABTH18646AHV |
Scan Test Devices With 18-Bit Transceivers And Registers |
Texas Instruments |
2342 |
SNJ54BCT8240AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
2343 |
SNJ54BCT8240AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
2344 |
SNJ54BCT8244AFK |
Scan Test Devices With Octal Buffers |
Texas Instruments |
2345 |
SNJ54BCT8244AJT |
Scan Test Devices With Octal Buffers |
Texas Instruments |
2346 |
SNJ54BCT8245AFK |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
2347 |
SNJ54BCT8245AJT |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
2348 |
SNJ54BCT8373AFK |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
2349 |
SNJ54BCT8373AJT |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
2350 |
SNJ54BCT8374AFK |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
2351 |
SNJ54BCT8374AJT |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
2352 |
SNJ54LVT18502HV |
3.3V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
Texas Instruments |
2353 |
SNJ54LVTH18502AHV |
3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers |
Texas Instruments |
2354 |
STA400EP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
2355 |
STA400MTEP |
STA400EP IEEE 1149.4 Analog Test Access Device |
National Semiconductor |
2356 |
TPAM166L3.9 |
Array module. Integrated optics, multiplexer, amplifier, reference and self test function. |
PerkinElmer Optoelectronics |
2357 |
TXS100ZA |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2358 |
TXS100ZB |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2359 |
TXS100ZY |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2360 |
TXS75ZA |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2361 |
TXS75ZB |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2362 |
TXS75ZY |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2363 |
TXS80ZD |
Input voltage range 36�75V DC Single 80�100A output 1500V DC I/O electrical strength test voltage |
Power-One |
2364 |
UPD652XX |
CMOS 8 LCX 3 Volt / CMOS Gate Arrays Crosscheck Test Support |
NEC |
2365 |
USER'S MANUAL |
AMD Test Interface Port Board User's Manual |
Advanced Micro Devices |
2366 |
V62/04730-01XE |
Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers 64-TSSOP -40 to 85 |
Texas Instruments |
2367 |
WT8046N24P1 |
Synchronous signal discriminator and power saving detector and test pattern for green monitor |
Weltrend Semiconductor |
2368 |
WT8046N24P2 |
Synchronous signal discriminator and power saving detector and test pattern for green monitor |
Weltrend Semiconductor |
2369 |
WT8046N24P3 |
Synchronous signal discriminator and power saving detector and test pattern for green monitor |
Weltrend Semiconductor |
2370 |
WT8046N24P4 |
Synchronous signal discriminator and power saving detector and test pattern for green monitor |
Weltrend Semiconductor |
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