| No. |
Part Name |
Description |
Manufacturer |
| 3781 |
APX803-40SRG-7 |
3-Pin Microprocessor Reset Circuit |
Diodes |
| 3782 |
APX809-40SAG-7 |
3-Pin Microprocessor Reset Circuit |
Diodes |
| 3783 |
APX809-40SRG-7 |
3-Pin Microprocessor Reset Circuit |
Diodes |
| 3784 |
APX810-40SAG-7 |
3-Pin Microprocessor Reset Circuit |
Diodes |
| 3785 |
APX810-40SRG-7 |
3-Pin Microprocessor Reset Circuit |
Diodes |
| 3786 |
APX811-40UG-7 |
4-Pin Microprocessor Supervisor With Manual Reset |
Diodes |
| 3787 |
APX812-40UG-7 |
4-Pin Microprocessor Supervisor With Manual Reset |
Diodes |
| 3788 |
APX823-40W5G-7 |
Manual Reset Input, Active Low Output Reset Generator with Watchdog Timer |
Diodes |
| 3789 |
APX824-40W5G-7 |
Active High or Low Output Reset Generator with Watchdog Timer |
Diodes |
| 3790 |
APX825A-40W6G-7 |
Manual Reset Input, Active High or Low Output Reset Generator with Watchdog Timer |
Diodes |
| 3791 |
AS4C14400-40JC |
1M-bit � 4 CMOS DRAM fast page mode, single 5V power supply, 40ns |
Alliance Semiconductor |
| 3792 |
AS4C14400-40TC |
1M-bit � 4 CMOS DRAM fast page mode, single 5V power supply, 40ns |
Alliance Semiconductor |
| 3793 |
AS4C14405-40JC |
1M-bit � 4 CMOS DRAM EDO, single 5V power supply, 40ns |
Alliance Semiconductor |
| 3794 |
AS4C14405-40TC |
1M-bit � 4 CMOS DRAM EDO, single 5V power supply, 40ns |
Alliance Semiconductor |
| 3795 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3796 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3797 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3798 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3799 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3800 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3801 |
AS91L1001E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3802 |
AS91L1001E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3803 |
AS91L1001E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3804 |
AS91L1001E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3805 |
AS91L1001E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3806 |
AS91L1001S-40F100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test controller |
Alliance Semiconductor |
| 3807 |
AS91L1001S-40F100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test controller |
Alliance Semiconductor |
| 3808 |
AS91L1001S-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3809 |
AS91L1001S-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
| 3810 |
AS91L1001S-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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