No. |
Part Name |
Description |
Manufacturer |
3871 |
AS91L1003U-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3872 |
AS91L1006BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3873 |
AS91L1006BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3874 |
AS91L1006BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3875 |
AS91L1006BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3876 |
AS91L1006BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3877 |
AS91L1006BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3878 |
AS91L1006E-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3879 |
AS91L1006E-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3880 |
AS91L1006E-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3881 |
AS91L1006E-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3882 |
AS91L1006E-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3883 |
AS91L1006S-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3884 |
AS91L1006S-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3885 |
AS91L1006S-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3886 |
AS91L1006S-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3887 |
AS91L1006S-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3888 |
AS91L1006S-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3889 |
AS91L1006U-40F100-CG |
3 to 3.6 V, 40 MHz TCK, 6-port JTAG gateway |
Alliance Semiconductor |
3890 |
AS91L1006U-40F100-IG |
3 to 3.6 V, 40 MHz TCK, 6-port JTAG gateway |
Alliance Semiconductor |
3891 |
AS91L1006U-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3892 |
AS91L1006U-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3893 |
AS91L1006U-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3894 |
AS91L1006U-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3895 |
AS91L1006U-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3896 |
AS91L1006U-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
3897 |
ASM5CVF857-40QR |
60 MHz to 200 MHz, 2.5 V wide-range frequency clock driver |
Alliance Semiconductor |
3898 |
ASM5CVF857-40QT |
60 MHz to 200 MHz, 2.5 V wide-range frequency clock driver |
Alliance Semiconductor |
3899 |
AT-400 |
Fixed Attenuators (N,BNC,TNC) |
Hirose Electric |
3900 |
AT-401 |
Fixed Attenuators (N,BNC,TNC) |
Hirose Electric |
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