| No. |
Part Name |
Description |
Manufacturer |
| 481 |
2V275 |
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 430 V @ 1mA DC test current. |
NTE Electronics |
| 482 |
2V300 |
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 470 V @ 1mA DC test current. |
NTE Electronics |
| 483 |
2V420 |
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 680 V @ 1mA DC test current. |
NTE Electronics |
| 484 |
2V480 |
Metal oxide varistor. Case diameter 16 mm. Nominal varistor voltage 750 V @ 1mA DC test current. |
NTE Electronics |
| 485 |
524V13 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 216 V @ 1mA DC test current. |
NTE Electronics |
| 486 |
524V15 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 240 V @ 1mA DC test current. |
NTE Electronics |
| 487 |
524V17 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 270 V @ 1mA DC test current. |
NTE Electronics |
| 488 |
524V25 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 390 V @ 1mA DC test current. |
NTE Electronics |
| 489 |
524V27 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 430 V @ 1mA DC test current. |
NTE Electronics |
| 490 |
524V30 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 470 V @ 1mA DC test current. |
NTE Electronics |
| 491 |
524V42 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 680 V @ 1mA DC test current. |
NTE Electronics |
| 492 |
524V48 |
Metal oxide varistor. Case diameter 23 mm. Nominal varistor voltage 750 V @ 1mA DC test current. |
NTE Electronics |
| 493 |
5962-9172501M3A |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 494 |
5962-9172501MLA |
Scan Test Devices With Octal D-type Latches |
Texas Instruments |
| 495 |
5962-9172601M3A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 496 |
5962-9172601MLA |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 497 |
5962-9172701Q3A |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 498 |
5962-9172701QLA |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
Texas Instruments |
| 499 |
5962-9172801Q3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 500 |
5962-9172801QLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 501 |
5962-9174601Q3A |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 502 |
5962-9174601QLA |
Scan Test Devices With Octal Buffers |
Texas Instruments |
| 503 |
5962-9318601M3A |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 504 |
5962-9318601MLA |
Scan Test Devices With Octal Bus Transceivers |
Texas Instruments |
| 505 |
5962-9458601Q3A |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 506 |
5962-9458601QXA |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
| 507 |
5962-9460102QXA |
Scan Test Devices With 18-Bit Bus Transceivers |
Texas Instruments |
| 508 |
5962-9461501Q3A |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 509 |
5962-9461501QXA |
Scan Test Devices With Octal Registered Bus Tranceivers |
Texas Instruments |
| 510 |
5962-9461601Q3A |
Scan Test Devices With Octal Bus Transceivers And Registers |
Texas Instruments |
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