No. |
Part Name |
Description |
Manufacturer |
601 |
ADJ23124 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 24 V DC. 1 form A. 2 coil latching type. Flux-resistant type. With test button. |
Matsushita Electric Works(Nais) |
602 |
ADJ23148 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 48 V DC. 1 form A. 2 coil latching type. Flux-resistant type. With test button. |
Matsushita Electric Works(Nais) |
603 |
ADJ24005 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 5 V DC. 1 form A. 2 coil latching type. Sealed type. Without test button. |
Matsushita Electric Works(Nais) |
604 |
ADJ24006 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 6 V DC. 1 form A. 2 coil latching type. Sealed type. Without test button. |
Matsushita Electric Works(Nais) |
605 |
ADJ24012 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 12 V DC. 1 form A. 2 coil latching type. Sealed type. Without test button. |
Matsushita Electric Works(Nais) |
606 |
ADJ24024 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 24 V DC. 1 form A. 2 coil latching type. Sealed type. Without test button. |
Matsushita Electric Works(Nais) |
607 |
ADJ24048 |
DJ-relay. 16A, compact and high-insulation power latching relay. Coil voltage 48 V DC. 1 form A. 2 coil latching type. Sealed type. Without test button. |
Matsushita Electric Works(Nais) |
608 |
AN-24 |
A Simplified Test Set for Op Amp Characterization |
National Semiconductor |
609 |
AN-923 |
Application Note - 800MHz test fixture design |
Motorola |
610 |
AN647 |
HOW TO TEST OUTPUT RIPPLE AND NOISE OF POWER SUPPLIES |
SGS Thomson Microelectronics |
611 |
AN987 |
ST7 - SERIAL TEST CONTROLLER PROGRAMMING |
SGS Thomson Microelectronics |
612 |
APPLICATION NOTE |
800MHZ TEST FIXTURE DESIGN |
Motorola |
613 |
APPLICATION-NOTE |
3 Tones Intermodulation test (specification TV 05001) |
TRW |
614 |
AS91L1001BU-10L100-C |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
615 |
AS91L1001BU-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
616 |
AS91L1001BU-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
617 |
AS91L1001BU-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
618 |
AS91L1001BU-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
619 |
AS91L1001BU-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
620 |
AS91L1001BU-40L100-C |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
621 |
AS91L1001BU-40L100-CF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
622 |
AS91L1001BU-40L100-CG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
623 |
AS91L1001BU-40L100-I |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
624 |
AS91L1001BU-40L100-IF |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
625 |
AS91L1001BU-40L100-IG |
3 to 3.6 V, 40 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
626 |
AS91L1001E-10L100-CF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
627 |
AS91L1001E-10L100-CG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
628 |
AS91L1001E-10L100-I |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
629 |
AS91L1001E-10L100-IF |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
630 |
AS91L1001E-10L100-IG |
3 to 3.6 V, 10 MHz TCK, JTAG test sequencer |
Alliance Semiconductor |
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