| No. |
Part Name |
Description |
Manufacturer |
| 5431 |
REF5025SHKJ |
High Temperature Low Noise, Very Low Drift, Precision Voltage References 8-CFP -55 to 210 |
Texas Instruments |
| 5432 |
REF5025SHKQ |
High Temperature Low Noise, Very Low Drift, Precision Voltage References 8-CFP -55 to 210 |
Texas Instruments |
| 5433 |
REF5025SKGD1 |
High Temperature Low Noise, Very Low Drift, Precision Voltage References 0-XCEPT -55 to 210 |
Texas Instruments |
| 5434 |
REF5025SKGD2 |
High Temperature Low Noise, Very Low Drift, Precision Voltage References 0-XCEPT -55 to 210 |
Texas Instruments |
| 5435 |
REJ03C0098_R1LV0408C |
Wide Temperature Range Version 4M SRAM (512-kword 8-bit) |
Hitachi Semiconductor |
| 5436 |
RESISTORS - WIREWOUND FUSE RESISTORS |
Fusible, Fast Acting Molded Styles, Custom Designed for Your Application, High Temperature Silicone Molded Package |
Vishay |
| 5437 |
RFSA4013 |
50 - 6000 MHz Temperature Compensating Attenuator |
Qorvo |
| 5438 |
RHY17 |
Hall-effect device measuring magnetic field at low temperatures |
Siemens |
| 5439 |
RHY18 |
Hall-effect device measuring magnetic field at low temperatures |
Siemens |
| 5440 |
RHY18-S1 |
Hall-effect device measuring magnetic field at low temperatures |
Siemens |
| 5441 |
RMK-HT |
Dual In Line, High Temperature, Hermetic Resistor Networks and Chips |
Vishay |
| 5442 |
RPY31 |
Infrared photoconductive detector, indium antimonide detector for liquid N2 temperature 77K operation |
Mullard |
| 5443 |
RPY36 |
Infrared photoconductive detector, indium antimonide detector for liquid N2 temperature 77K operation |
Mullard |
| 5444 |
RPY37 |
Infrared photoconductive detector, cooper doped germanium detector for liquid Helium temperature 4.2K operation |
Mullard |
| 5445 |
RPY40 |
Infrared photoconductive detector, cooper doped germanium detector for liquid Helium temperature 4.2K operation |
Mullard |
| 5446 |
RPY57 |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 5447 |
RPY75 |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 5448 |
RPY75A |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 5449 |
RPY76 |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 5450 |
RPY76A |
Infrared photoconductive detector, lead sulphide detector for room temperature operation |
Mullard |
| 5451 |
RPY77 |
Infrared photoconductive detector, indium antimonide labyrinth detector for room temperature operation |
Mullard |
| 5452 |
RPY78 |
Infrared photoconductive detector, indium antimonide labyrinth detector for room temperature operation |
Mullard |
| 5453 |
RPY79 |
Infrared photoconductive detector, indium antimonide labyrinth detector for room temperature operation |
Mullard |
| 5454 |
RPY80 |
Infrared photoconductive detector, indium antimonide labyrinth detector for room temperature operation |
Mullard |
| 5455 |
S-8100 |
CMOS TEMPERATURE COMPENSATION IC |
Seiko Instruments Inc |
| 5456 |
S-8100BF |
CMOS temperature compensation IC |
Epson Company |
| 5457 |
S-8100BF |
CMOS TEMPERATURE COMPENSATION IC |
Seiko Instruments Inc |
| 5458 |
S-8101 |
CMOS TEMPERATURE COMPENSATION IC |
Seiko Instruments Inc |
| 5459 |
S-8101A |
CMOS temperature compensation IC |
Epson Company |
| 5460 |
S-8101A |
CMOS TEMPERATURE COMPENSATION IC |
Seiko Instruments Inc |
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