| No. |
Part Name |
Description |
Manufacturer |
| 5521 |
SAP09P |
Darlington Transistor For Audio Amplifier With Temperature Compensation |
Sanken |
| 5522 |
SAP10 |
Darlington transistors with built-in temperature compensation diodes for audio amplifier applications |
Sanken |
| 5523 |
SAP10N |
Darlington Transistor For Audio Amplifier With Temperature Compensation |
Sanken |
| 5524 |
SAP10P |
Darlington Transistor For Audio Amplifier With Temperature Compensation |
Sanken |
| 5525 |
SAP15 |
Darlington transistors with built-in temperature compensation diodes for audio amplifier applications |
Sanken |
| 5526 |
SAP15N |
Darlington transistors with built-in temperature compensation diodes for audio amplifier applications |
Sanken |
| 5527 |
SAP15P |
Darlington transistors with built-in temperature compensation diodes for audio amplifier applications |
Sanken |
| 5528 |
SAP16N |
Darlington Transistor For Audio Amplifier With Temperature Compensation |
Sanken |
| 5529 |
SAP16P |
Darlington Transistor For Audio Amplifier With Temperature Compensation |
Sanken |
| 5530 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 5531 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 5532 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 5533 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 5534 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 5535 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 5536 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 5537 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 5538 |
SCAN921226H |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
| 5539 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 5540 |
SCAN921226HSM |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 5541 |
SCAN921226HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
| 5542 |
SCAN921226HSMX |
High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
| 5543 |
SDE2526 |
Nonvolatile Memory 2-Kbit E2PROM with I2C Bus Interface with Extended Temperature Range |
Siemens |
| 5544 |
SDE2526-5 |
Nonvolatile Memory 2-Kbit E2PROM with I2C Bus Interface with Extended Temperature Range |
Siemens |
| 5545 |
SDE2526-5A2G |
Nonvolatile Memory 2-Kbit E2PROM with I2C Bus Interface with Extended Temperature Range |
Siemens |
| 5546 |
SDE25X26-5A2G |
Nonvolatile Memory 2-Kbit E2PROM with I2C Bus Interface with Extended Temperature Range |
Siemens |
| 5547 |
SDE25X26A2 |
Nonvolatile Memory 2-Kbit E2PROM with I2C Bus Interface with Extended Temperature Range |
Siemens |
| 5548 |
SE95 |
Ultra high accuracy digital temperature sensor and thermal Watchdog(tm) |
Philips |
| 5549 |
SE95D |
Ultra high accuracy digital temperature sensor and thermal watchdog |
NXP Semiconductors |
| 5550 |
SE95DP |
Ultra high accuracy digital temperature sensor and thermal watchdog |
NXP Semiconductors |
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