No. |
Part Name |
Description |
Manufacturer |
61 |
MNDS26F32MW/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
62 |
MNDS26F32MWG/883 |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
63 |
MNDS26F32MWGRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
64 |
MNDS26F32MWR-QML |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
65 |
MNDS26F32MWRQMLV |
QUAD DIFFERENTIAL LINE RECEIVERS ALSO AVAILABLE GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5, CONDITION A |
National Semiconductor |
66 |
MNLM136A |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
67 |
MNLM136A-2.5-X |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
68 |
MNLM136A-2.5-X-RH |
2.5V REFERENCE DIODE, GUARANTEED TO 100K RAD(Si) TESTED TO MIL-STD-883, METHOD 1019.5 |
National Semiconductor |
69 |
MNLMH6628-X-RH |
DUAL WIDEBAND, LOW-NOISE, VOLTAGE FEEDBACK OP AMP, GUARANTEED TO 300k rd (si) TESTED TO MIL-STD-883, METHOD 1019 |
National Semiconductor |
70 |
MRCN |
Molded Sip, Molded Epoxy Case, Solderability per MIL-STD-202 Method 208E, Marking Resistance to Solvents per MIL-STD-202 Method 215 |
Vishay |
71 |
MRCN |
Molded Sip, Molded Epoxy Case, Solderability per MIL-STD-202 Method 208E, Marking Resistance to Solvents per MIL-STD-202 Method 215 |
Vishay |
72 |
MRLM111 |
Total supply voltage: 36V; negative V.: -30V; positiveV: +30V; voltage comparator: also available guaranteed to 30k rd (Si) tested to MIL-STD-883, method 1019 |
National Semiconductor |
73 |
PLCC-44 |
Surface Mount PLCC Sockets |
Methode Electronics Incorporated |
74 |
READ-ME_HCS12 |
READ-ME_HCS12 -- HCS12 Document Methodology |
Motorola |
75 |
SOLDERING |
Soldering information - maximul conditions, flow soldering method |
PLESSEY Semiconductors |
76 |
SP1450B(B) |
PCM Signal Monitor circuit, are screened to MIL-STD-883, Method 5004, Class B |
PLESSEY Semiconductors |
77 |
SP1455B(B) |
PCM Signal Monitor circuit, are screened to MIL-STD-883, Method 5004, Class B |
PLESSEY Semiconductors |
78 |
SRS252X |
1mm Micro Headers |
Methode Electronics Incorporated |
79 |
TMP86C420 |
The product information available by this search method contains an overview of each product only. |
TOSHIBA |
80 |
TMP86C820 |
The product information available by this search method contains an overview of each product only. |
TOSHIBA |
81 |
TMP86C829 |
The product information available by this search method contains an overview of each product only. |
TOSHIBA |
82 |
TMP86C845 |
The product information available by this search method contains an overview of each product only. |
TOSHIBA |
83 |
TMP86C846 |
The product information available by this search method contains an overview of each product only. |
TOSHIBA |
84 |
TMP86C847 |
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TOSHIBA |
85 |
TMP86CH06 |
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TOSHIBA |
86 |
TMP86CH21 |
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TOSHIBA |
87 |
TMP86CH29 |
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TOSHIBA |
88 |
TMP86CH46 |
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TOSHIBA |
89 |
TMP86CH47 |
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TOSHIBA |
90 |
TMP86CK74 |
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TOSHIBA |
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