No. |
Part Name |
Description |
Manufacturer |
631 |
SCAN90CP02SPX |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 |
National Semiconductor |
632 |
SCAN90CP02VY |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 |
National Semiconductor |
633 |
SCAN90CP02VY/NOPB |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 32-LQFP -40 to 85 |
Texas Instruments |
634 |
SCAN90CP02VYX |
1.5 Gbps 2x2 LVDS Crosspoint Switch with Pre-Emphasis and IEEE 1149.6 |
National Semiconductor |
635 |
SCAN921023 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
636 |
SCAN921023 |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
637 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
638 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
639 |
SCAN921023SLC/NOPB |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
640 |
SCAN921023SLCX |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
641 |
SCAN921025 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
642 |
SCAN921025 |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
643 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
644 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
645 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
646 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
647 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
648 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
649 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
650 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
651 |
SCAN921025SLC/NOPB |
30-80 MHz 10 Bit Bus LVDS Serializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
652 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
653 |
SCAN921224 |
20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
654 |
SCAN921224 |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
Texas Instruments |
655 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
656 |
SCAN921224SLC |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
657 |
SCAN921224SLC/NOPB |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
658 |
SCAN921224SLCX |
20 MHz-66MHz 10-Bit Deserializer with IEEE 1149.1 Test Access |
National Semiconductor |
659 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
660 |
SCAN921226 |
30-80 MHz 10 Bit Bus LVDS Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST 49-NFBGA |
Texas Instruments |
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