No. |
Part Name |
Description |
Manufacturer |
691 |
SCAN928028TUF |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
692 |
SCAN928028TUF |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
693 |
SCAN928028TUF/NOPB |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
694 |
SCAN928028TUFX |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST |
National Semiconductor |
695 |
SCAN928028TUFX |
8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 196-NFBGA -40 to 85 |
Texas Instruments |
696 |
SCANH162512SM |
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
National Semiconductor |
697 |
SCANH162602SM |
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
National Semiconductor |
698 |
SCANH162602SMX |
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
National Semiconductor |
699 |
SCANH16512SM |
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
National Semiconductor |
700 |
SCANH16602SM |
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
National Semiconductor |
701 |
SCANH16602SMX |
Low Voltage Universal 16-bit IEEE 1149.1 Bus Transceiver with TRI-STATE Outputs |
National Semiconductor |
702 |
SCANPSC100F |
Embedded Boundary Scan Controller (IEEE 1149.1 Support) |
Fairchild Semiconductor |
703 |
SCANPSC110 |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
704 |
SCANPSC110F |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
Fairchild Semiconductor |
705 |
SCANPSC110F |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
National Semiconductor |
706 |
SCANPSC110FDM |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
National Semiconductor |
707 |
SCANPSC110FDMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
National Semiconductor |
708 |
SCANPSC110FE-QV |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
National Semiconductor |
709 |
SCANPSC110FFMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
710 |
SCANPSC110FJ-QV |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
National Semiconductor |
711 |
SCANPSC110FLMQB |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
National Semiconductor |
712 |
SCANPSC110FSC |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
Fairchild Semiconductor |
713 |
SCANPSC110FSCX |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
Fairchild Semiconductor |
714 |
SCANPSC110FW-QV |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) |
National Semiconductor |
715 |
SCANSTA101 |
Low Voltage IEEE 1149.1 STA Master |
National Semiconductor |
716 |
SCANSTA101 |
Low Voltage IEEE 1149.1 System Test Access (STA) Master |
Texas Instruments |
717 |
SCANSTA101SM |
Low Voltage IEEE 1149.1 STA Master |
National Semiconductor |
718 |
SCANSTA101SM |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
719 |
SCANSTA101SM/NOPB |
Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 |
Texas Instruments |
720 |
SCANSTA101SMX |
Low Voltage IEEE 1149.1 STA Master |
National Semiconductor |
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