| No. |
Part Name |
Description |
Manufacturer |
| 781 |
SN74ACT8994FN |
DIGITAL BUS MONITOR IEEE STD 1149.1 JTAG SCAN-CONTROLLED LOGIC/SIGNATURE ANALYZER |
Texas Instruments |
| 782 |
SN74BCT8240A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 783 |
SN74BCT8240ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 784 |
SN74BCT8240ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 785 |
SN74BCT8240ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers |
Texas Instruments |
| 786 |
SN74BCT8244A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 787 |
SN74BCT8244ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 788 |
SN74BCT8244ADWE4 |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-SOIC 0 to 70 |
Texas Instruments |
| 789 |
SN74BCT8244ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 790 |
SN74BCT8244ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers |
Texas Instruments |
| 791 |
SN74BCT8245A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 792 |
SN74BCT8245ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 793 |
SN74BCT8245ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 794 |
SN74BCT8245ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers |
Texas Instruments |
| 795 |
SN74BCT8373A |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 796 |
SN74BCT8373ADW |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 797 |
SN74BCT8373ADWR |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 798 |
SN74BCT8373ANT |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches |
Texas Instruments |
| 799 |
SN74LVCE161284 |
19-Bit IEEE 1284 Translation Transceiver with Error-Free Power Up |
Texas Instruments |
| 800 |
SN74LVCE161284DGGR |
19-Bit IEEE 1284 Translation Transceiver with Error-Free Power Up |
Texas Instruments |
| 801 |
SN74LVCE161284DL |
19-Bit IEEE 1284 Translation Transceiver with Error-Free Power Up |
Texas Instruments |
| 802 |
SN74LVCE161284DLR |
19-Bit IEEE 1284 Translation Transceiver with Error-Free Power Up |
Texas Instruments |
| 803 |
SN74LVCE161284VR |
19-Bit IEEE 1284 Translation Transceiver with Error-Free Power Up |
Texas Instruments |
| 804 |
SN74LVCZ161284A |
19-Bit IEEE 1284 Std Bus Interface |
Texas Instruments |
| 805 |
SN74LVCZ161284AGR |
19-Bit IEEE 1284 Std Bus Interface |
Texas Instruments |
| 806 |
SN74LVT8980 |
EMBEDDED TEST-BUS CONTROLLERS IEEE STD 1149.1 JTAG TAP MASTERS WITH 8-BIT GENERIC HOST INTERFACES |
Texas Instruments |
| 807 |
SN74LVT8980A |
Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces |
Texas Instruments |
| 808 |
SN74LVT8980A-EP |
Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85 |
Texas Instruments |
| 809 |
SN74LVT8980ADW |
Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces |
Texas Instruments |
| 810 |
SN74LVT8980ADWR |
Embedded Test-Bus Controllers IEEE STD 1149.1 (JTAG) TAP Masters W/ 8-Bit Generic Host Interfaces |
Texas Instruments |
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