No. |
Part Name |
Description |
Manufacturer |
8101 |
S524L50X51-DCB0, S524L50X51-SCB0, S524L5 |
16K-bit Serial EEPROM Data Sheet |
Samsung Electronic |
8102 |
S524LB0X91 |
32K/64K-bit Serial EEPROM |
Samsung Electronic |
8103 |
S524LB0X91-DCB0, S524LB0X91-SCB0, S524LB |
32K/64K-bit Serial EEPROM Data Sheet |
Samsung Electronic |
8104 |
S524LB0XB1 |
32K/64K-bit Serial EEPROM |
Samsung Electronic |
8105 |
S524LB0XB1-DCB0, S524LB0XB1-SCB0, S524LB |
32K/64K-bit Serial EEPROM Data Sheet |
Samsung Electronic |
8106 |
S8273B |
10-Bit serial-in, parallel-out shift register |
Signetics |
8107 |
S8273F |
10-Bit serial-in, parallel-out shift register |
Signetics |
8108 |
S8273W |
10-Bit serial-in, parallel-out shift register |
Signetics |
8109 |
SCAN921023 |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
8110 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8111 |
SCAN921023SLC |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
8112 |
SCAN921023SLC/NOPB |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 85 |
Texas Instruments |
8113 |
SCAN921023SLCX |
20 MHz-66MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8114 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8115 |
SCAN921025H |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
Texas Instruments |
8116 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8117 |
SCAN921025HSM |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8118 |
SCAN921025HSM/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8119 |
SCAN921025HSMX |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8120 |
SCAN921025HSMX/NOPB |
High Temperature 20MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access 49-NFBGA -40 to 125 |
Texas Instruments |
8121 |
SCAN921025SLC |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8122 |
SCAN921025SLCX |
30MHz - 80MHz 10-Bit Serializer with IEEE 1149.1 Test Access |
National Semiconductor |
8123 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
8124 |
SCAN921821 |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
Texas Instruments |
8125 |
SCAN921821EVK |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
8126 |
SCAN921821SM |
3.3 V, dual 18-bit serializer with pre-emphasis, IEEE 1149.1 (JTAG) and at-speed BIST |
National Semiconductor |
8127 |
SCAN921821TSM |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST |
National Semiconductor |
8128 |
SCAN921821TSM/NOPB |
Dual 18-Bit Serializer with Pre-Emphasis, IEEE 1149.1 (JTAG), and At-Speed BIST 100-NFBGA -40 to 85 |
Texas Instruments |
8129 |
SK100E445 |
4-Bit Serial/Parallel Converter |
Semtech |
8130 |
SK100E445PJ |
4-Bit Serial / Parallel Converter |
Semtech |
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